Multi-Site Kelvin Test Socket for Wafer Probe Handler
(Wafer Bump & BGA Devices)

Parison Verticle Probe Handler Socket is exclusively designed to cater for mass production.
It incorporates a Verticle C-pin Contactor that will provide high test yield and is able to withstand high current up to 15Amp.

>> Click on an image to view enlarged picture.

Parison designs Multi-Sites Wafer Bump Kelvin Socket

Vertical C-Pin Contactor
Socket Size 25 x 25 x 6.5mm
Device Guide Plate
Manual Lid Cover
Dual Sites (49 Balls Kelvin Contact)
Ball Pitch 0.5mm

4 Site Wafer Bump Kelvin Socket Manual Guide & Manual Lid Cover

0.5mm Pitch
IC Size 1.5 x 1.5mm
Socket Size 25 x 25 x 6.5mm
Vertical C-Pin Contactor

8 Site Wafer Bump Kelvin Socket

0.5mm Pitch
IC Size 1 x 1.5mm
Socket Size 25 x 25 x 6.5mm
Vertical C-Pin Contactor

8 Site Guide and cover for manual testing

TESEC Handler Quad Side MLP Vertical Probe Socket

IC 5 x 5mm MLP 28 LD
Socket Size 52 x 24mm

Parison Technology Products

Multi-Site Kelvin Test Socket for Wafer Probe Handler
(Wafer Bump & BGA Devices)

Parison designs Multi-Sites Wafer Bump Kelvin Socket

4 Site Wafer Bump Kelvin Socket Manual Guide & Manual Lid Cover

8 Site Wafer Bump Kelvin Socket

8 Site Guide and cover for manual testing

TESEC Handler Quad Side MLP Vertical Probe Socket

Address

Phone

Email

Parison Technology Products

Multi-Site Kelvin Test Socket for Wafer Probe Handler (Wafer Bump & BGA Devices)

Parison designs Multi-Sites Wafer Bump Kelvin Socket

4 Site Wafer Bump Kelvin Socket Manual Guide & Manual Lid Cover

8 Site Wafer Bump Kelvin Socket

8 Site Guide and cover for manual testing

TESEC Handler Quad Side MLP Vertical Probe Socket

Address

Phone

Email

Multi-Site Kelvin Test Socket for Wafer Probe Handler
(Wafer Bump & BGA Devices)